Surface Characterization


Woollam / M2000

The ellipsometer is a machine for measuring film thickness and refractive index using light. The machine is designed to measure film thickness to the nanometer. It also measures a film’s refractive index. The main specifications of the machine: Sample size: 5 to 200 mm diameter, spot diameter: 4 mm diameter, wavelength range: 248-995 nm.


Measurement and data analysis

[ 00:18:13 ]


Copyright © Photonics Advanced Research Center, Osaka University. All Rights Reserved.