Scanning probe microscope

The scanning probe microscope, SPM, is a system that enables observation of a nanoscale sample surface using a probe. With the system, no special sample pre-treatment is necessary. There are various modes for the SPM to obtain shape image or phisicality of a surface. The modes used in this lecture are the AFM and DFM modes. This lecture provides a general description and explains the operation of the scanning probe microscope.


Measurement and data analysis

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