Microscope

SEM-EDX

VE-8800

This machine is a type of electron microscope. Microscope images can be obtained by detecting secondary electrons generated from a surface, while scanning thin squeezed electron beam on the sample surface. As the image can be obtained using low voltage beams, even a non-conductive specimen can be observed without evaporation coating.
It is also able to perform elemental analysis by detecting characteristic X-rays, which are emitted with secondary electrons, using the auxiliary EDX detector. It can detect elements from Be to Pu.

1

SEM-EDX

[ 00:09:55 ]

2

SEM observation

[ 00:23:56 ]

3

EDX analysis

[ 00:28:29 ]

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